Test Probes for In-Circuit-Test (E-Series)

These are test probes for centers from 40 mil (1.00 mm) to 100 mil (2.54 mm) with a large selection of different tip styles and contact pressures for almost all test requirements.

In addition, test probe units with a longer test probe travel are available for 2-level adaptations. Receptacles with a press ring can be supplied for this series. This press ring can be used as a stop to achieve a constant extension height in the adapter, but it also allows variable heights if the press ring is pressed into a defined setting in the take-up drill hole. The ICT receptacles are available for various types of connections. In addition to these standards,

PTR HARTMANN also offers metric types for the ICT/FT. In this case, the receptacles are normally pressed into the take-up drill hole as far as the stop. Here, too, test probe barrels with different collar heights allow variable extension heights in the adapter.